Hi Thierry,
Leakage is an unspecified and therefore not guaranteed performance characteristic of our devices. However, NXP does perform a 100% leakage test on all ported devices after assembly. The intent/extent of NXP's test capabilities is as a manufacturing quality tool/gauge to identify gross leakers (devices outside the leak test limits), NOT to quantify leakage as a cc/sec performance characteristic.
Note: the test volume is constant for all of production, so we have removed the volume variable from the quantitative leak rate equation (specifically: LR[cc/sec] = deltaP[kPa] * V[cc] / t[sec]) to achieve our qualitative gauge in kPa/sec (specifically: LR[kPa/sec] = deltaP[kPa] / t[sec]), which is the basis for our leakage test methodology.
Unfortunately, the specific leak rate value for the MPX5004 is not available, I apologize for the problems this may cause.
If you are having leakage issues in your application, I recommend you to send me detailed description of your mechanical system and leakage rate you are seen.
Regards,
Jose
NXP Semiconductors