S32K396 sCheck SRAM ECC Test failure

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S32K396 sCheck SRAM ECC Test failure

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nxf47333
NXP Employee
NXP Employee

Hi Team,

my customer Deepal, met sCheck SRAM ECC test failure issue.

environment :

RTD :SW32K3_RTD_4.4_R21-11_3.0.0

SAF: S32K396_SAF_0.9.0

Complier: GHS

the detail issue is, when run sCheck SRAM ECC startup test. after CPU entered Hardfault, HFSR register was cleaned.

nxf47333_0-1716301096387.png

so BusFault_Handler can't be entered. which leading sCheck SRAM ECC test failure.

we test the issue with SAF demo code on SAF 0.9 and SAF 1.0 with GCC compiler, no such issue.

Could you please help give suggestion on debugging.

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Yongbing_Nan
NXP Employee
NXP Employee
Hi,
The root cause is that the exception code flow will be affected by the Lauterbach debugger with step debug method. Both the SRAM0 and SRAM1 ECC test successfully when free run the test function sCheck_CallTestFunc() and close all of the Lauterbach Onchip trigger break point.
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