Hi,
All semiconductors are affected by temperature. As shown in the notes for Table 42 of S32K1 data sheet [Page 58, S32K1xx Data Sheet, Rev. 14, 08/2021], it is stated that the typical values were taken at 25°C (unless otherwise noticed).
As to what extent, this is to be tested on the conditions you are required. The datasheet gives you a guidance on what values you can take on a Worst-Case analysis, but verification is recommended.
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