Hello @VaneB , thank you for your response. Your information is appreciated. Can you clarify a few further points below?
>The Low Power Oscillator (LPO) frequency is trimmed to be close to 128kHz during production at room temperature. Each trim step adjusts the frequency by approximately 3kHz, so it cannot be trimmed precisely to 128kHz.
This is understandable. I expect a wide variation in part to part LPO frequencies, because of the wide range given in the data sheet.
However, I am running this test using a device sitting on my desk. This should be reasonably close to ambient conditions. A measured output of ~105kHz is many ~3kHz steps away from 128kHz. It seems that the default PMC_LPOTRIM value with my device at or close to room temperature should result in a value much closer to the target frequency of 128kHz, and certainly within the range stated on the data sheet.
>The LPO frequency is heavily dependent on operational conditions, and there is no official specification for its characteristics.
How can this be true? The data sheet states the operating range for the LPO frequency. Is the data sheet not an official specification?
I would also like to reference the NXP-S32K1xx Series Safety Manual, revision 5. I will not duplicate the exact content here as the document is not public. Please refer to assumption [SM_067], in section 5.6.9, specifically the final sentence. If this assumption is followed, and the LPO clock does not have a specification for its characteristics, how is it possible to define the watchdog window values?