问题:
压力升级测试6W次,开始偶现FLASH擦除失败问题。 复现概率1/300
擦除使用库函数 address = const 0x0000e000U,size = const 0x32000U:
出现问题ret不为seccess。
现在急需想寻求帮,flash可编程最大次数为? S32K-RM.pdf中是否有相关说明,如果有请指出。
谢谢。
uint16_t FlashErase(uint32_t address, uint32_t size)
{
uint16_t ret = STATUS_SUCCESS;
/*关全局中断*/
INT_SYS_DisableIRQGlobal();
/*erase*/
ret = FLASH_DRV_EraseSector(&g_tflashSSDConfig, address, size);
if(STATUS_SUCCESS != ret)
{
INT_SYS_EnableIRQGlobal();
return ret;
}
// DEV_ASSERT(STATUS_SUCCESS == ret);
/* Verify */
ret = FLASH_DRV_VerifySection(&g_tflashSSDConfig, address, size / FTFx_DPHRASE_SIZE, 1u);
/*开全局中断*/
INT_SYS_EnableIRQGlobal();
return ret;
}
Question:
The pressure upgrade test was conducted for 6W times, and the flash erase failure problem began to occur occasionally. Recurrence probability 1/300
Erase using library function address=const 0x0000e000U, size=const 0x32000U:
When there is a problem, ret is not second.
Now we need help urgently. What is the maximum number of times flash can be programmed? Whether there are relevant instructions in S32K-RM.pdf. If yes, please indicate.
thank you.