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* Test HW: S32K3X4EVB-Q172
* MCU: S32K312
* Compiler: S32DS3.5
* SDK release: RTD 3.0.0
* Debugger: PE Micro
* Target: internal_FLASH
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Example MCAL S32K312 MEM_InFls DS3.5 RTD300 :--
Example MCAL S32K312 MEM_InFls DS3.5 RTD300 - NXP Community
Example MCAL S32K312 FEE DS3.5 RTD300 :--
Example MCAL S32K312 FEE DS3.5 RTD300 - NXP Community
Example MCAL S32K312 FEE and MEM_InFls DS3.5 RTD300 :--
Example MCAL S32K312 FEE and MEM_InFls DS3.5 RTD300 - NXP Community
Example MCAL S32K312 PWM ICU using Custom IRQ EMIOS DS3.5 RTD300 :--
Example MCAL S32K312 PWM ICU using EMIOS DS3.5 RTD300 - NXP Community
Example ASR S32K312 EMIO PWM Generation & Duty capture using Interrupt DS3.5 RTD300 :--
Example ASR S32K312 EMIO PWM Generation & Duty capture using Interrupt DS3.5 RTD300 - NXP Community
Example ASR S32K312 EMIO PWM Generation & Duty capture using Polling DS3.5 RTD300 :--
Example ASR S32K312 EMIO PWM Generation & Duty capture using Polling DS3.5 RTD300 - NXP Community
Pe Micro use to delete the Dataflash, on every new FLashing of firmware, which corrupts the EEPROM data.
After making this changes in debug configuration it worked..
