update "Using the SAR-ADC in Linux" section in S32G SDK user manual

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update "Using the SAR-ADC in Linux" section in S32G SDK user manual

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hittzt
Senior Contributor I

Hi,

 

In latest SDK BSP44 user manual, the iio test cases in "19.2 Using the SAR-ADC in Linux", if users test "Software triggered mode" then execute "Scan (continuous) conversions in normal mode" by iio_generic_buffer command, then the iio_generic_buffer command may hang there without any outputs, it is because that the trigger settings should be cleard before scan mode test.

So would you please help to update the SDK user manual to make it more clear for users to use iio device test?

 

Thanks,

Zhantao

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chenyin_h
NXP Employee
NXP Employee

Thanks, @hittzt 

I am able to understand your suggestions. 

From my opinion, since section2 and section3 are used to introduce different modes/functionalities, so that potentially the assumption for testing each is based on a pure environment.

Whatever, I will try to discuss it internally.

Thanks for your kindly suggestion.

 

BR

Chenyin

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chenyin_h
NXP Employee
NXP Employee

Hello, @hittzt 

Thanks for your post.

Would your mind attaching the test log? then I could report it to the corresponding channel.

Thank you very much for your feedback on the document.

 

BR

Chenyin

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hittzt
Senior Contributor I

Hi @chenyin_h,

 

Sorry for late responce.

 

In BSP44 S32G3 user manual, the section "19.2 Using the SAR-ADC in Linux" includes following modes:

    "2. Software triggered mode"

    "3. Scan (continuous) conversions in normal mode"

if after testing the 2 mode following the related steps, then execute 3 mode directly, the commands "hexdump -e '"iio0 :" 8/2 "%04x " "\n"' /dev/iio:device0 | head -20" or "iio_generic_buffer -N 0 -g -l 4096" will hang there.

 

I did not save my test log, but it is easy to reproduce the issue by above steps.

 

Thanks,

Zhantao

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