Hi NXP
I am integrating SAF into our project, and the recovery mechanism for most of NCF is R1.
During the workshop by NXP , in order to R1 recover, it needs clear both the FCCU status register and the fault source for R1 recover.
I want to know how to clear the fault source for each NCF? Does NXP have corresponding materials for explanation?
I downloaded the Application note AN12866 from S32V23x, it only mention the following recovery methods:
Hi,
The following information is provided under the S32G2 reference manual:
Is this the information you are requesting?
Please, let us know.
Hi,
Thanks! for all NCF, does it only need to clear the NCF register by writing twice to the NCF status register?
From the sheet of "Fault clearing Mechanism" in "S32V234_NCF_List", it is mentioned not only to clear the NCF stauts register, but also some other register, for example, For NCF[0], Clear TMU_IDR, and the stauts in FCCU_NCF_S0[0].
For S32G2, is there a document similar to this one that explains how to fault recovery when R1 is used?
Hi,
As said under the S32G2 RM, the fault should be cleared after writing 2 times to the status register.
Using the S32V as an example could be misleading, since S32V and S32G have a different architecture, even if the names share similarities. As for documents, we are not seeing anything on this regard, we do apologize.
Please, let us know.