Hi,
Attempting to generate a preliminary Reliability Prediction analyses to meet customer preliminary critical document requirement review report, was wondering whether it would be possible to acquire the Failure Rate (MTTF or MTBF or FIT) for the following product:PMEG4010BEA (PMEG4010 Schottky Diode).
Thank you,
Christopher
Solved! Go to Solution.
Hello Christopher,
I hope all is great with you. Thank you for using the NXP communities.
Please note that the PMEG4010BEA device was transferred to NEXPERIA.
I do recommend ask such material in https://www.nexperia.com/
I hope this information helps.
Regards,
David
Hello Christopher,
I hope all is great with you. Thank you for using the NXP communities.
Please note that the PMEG4010BEA device was transferred to NEXPERIA.
I do recommend ask such material in https://www.nexperia.com/
I hope this information helps.
Regards,
David
David,
Thanks.