S32V234 Boundary Scan Test Enable

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S32V234 Boundary Scan Test Enable

Contributor I

Hello, I'm trying to enable the Bscan Cells for the s32v234, sending the 4'b0110 to the Instruction Register and then the h200_00000000_00000000_00000000_74020000_07003E10 through the Data Register, as is specified in the BSDL, but the Boundary-scan is not working.

I have to do any other step or instruction before or after, to enable the boundary scan test in the ICT?

Here is the instruction for the BSDL.

-- *****************************************************************************
-- BSDL file for design --> s32v234
-- Company --> Freescale Semiconductor
-- Designer --> b37480
-- BSDL file generated on --> 11-Jul-2015
-- Tool --> BSDL_GEN, Version 5.0
-- JTAG Data Register with opcode 4'b0110 need to be programmed to run bscan.
-- Opcode: 4'b0110
-- Data : 170?h200_00000000_00000000_00000000_74020000_07003E10
-- *****************************************************************************

Attached you can find the PCF created to load both registers with the requested data.

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NXP TechSupport
NXP TechSupport

Please be informed, that all support to S32V234 is done via tickets. This Community is not appropriate for questions of this kind. Our engineer will answer your questions via opened Support Case.


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