I am interested in using the AFIC10275N in a new design. Is there test data available for the evaluation board. I am particularly interested in harmonic content at the output as well as in-band noise with no input signal.
In addition, I am targeting 200W rather than 250W output power. Is there test data at different supply voltages?
I would appreciate any test data available on this device or eval board.
Please create a Service request.
Any answers? I have an active design and I assumed that NXP would provide sport through this forum. I also purchased the evaluation board but it came with supporting NO documentation, not even labeling on the IO or power terminals . The data sheet is exceptionally lacking in terms of guidance of how to bias the gates and the app notes are generic and do not claim to be applicable to this device. In particular the datasheet does not specify the current multiplier for gate biasing of the two stages. It does also not provide guidance in terms of drain voltage for stage 1.
Does anybody have suggestions in terms of how to get support from NXP?