Hi,
I finally had a time to look at your excel.
CF[16] - Inject multibit ECC error into Flash memory by SW.
CF[22] - IS triggered when self test configuration is loaded from shadow flash and an error is detected in SSCM STCU device configuration client. - This fault is possible to trigger by SW however the shadow flash STCU content is defined in reference manual. Not following manual and writing incorrect data into for STCU into shadow flash can emulate this fault state and trigger this fault. I will be very careful here and not try to write incorrect data into shadow flash.
CF[23 -24] - HW fault which you cannot emulate by SW.
CF[27] - Unintended activation of STCU in application mode. Not possible to trigger by SW.
CF[28-31] - Unintended activation of TCU signals other then in NXP factory tests. Not possible to emulate by SW.
CF[37] - Error signals in JTAG. Possible to emulate by disconnecting JTAG from device in debug mode under power. Disconnect JTAG few times from running application and you will get this fault.
NCF[0] - Core watchdog_0 expiration - configure and let expire core watchdog_0
NCF[1] - Core watchdog_1 expiration - configure and let expire core watchdog_1
NCF[2 - 3] - Unlock PLL0 - for example disconnect XTAL which supply acitve PLL
NCF[21] - Mode transition to reset mode.
NCF[22-24] - When ballast transistor is bypassed (accidental malfunction / failure). Not possible to trigger by SW.
Peter
