********************************************************************************
* Detailed Description:
* Purpose of the example is to show how to generate Multi bit ECC error in
* internal SRAM or FLASH (user can choose it in the option at the end of main
* function) and how to handle this error with respect to constraints given by
* MPC5675K architecture (ECSM/RGM/FCCU relation and ECC error handling through
* reset). The example is only possible to run in internal_FLASH target. Power-
* -on-reset is required after downloading the code into MCU's flash. The example
* displays notices in the terminal window (setting specified below). No other
* external connection is required.
* Example also shows impact of enabled cache (macro OPTIMIZATIONS_ON).
*
* ------------------------------------------------------------------------------
* Test HW: MPC5675KEVB
* MCU: PPC5675KFMMSJ in Lock-Step mode
* Fsys: 180/150 MHz CORE_CLK
* Debugger: Lauterbach Trace32
* PeMicro USB-ML-PPCNEXUS
* Target: RAM, internal_FLASH
* Terminal: 19200-8-no parity-1 stop bit-no flow control on eSCI_A
* EVB connection: default
*
********************************************************************************