The test is explained under the register setting DDR_MTCR. These memory tests have 40-byte data test patterns repeated and used for the test. The data patterns are populated at the 10 DDR_MTP registers. The test can be read only, write only, or write-read-compare selectable with DDR_MTCR[MT_TYP]. If a range is enabled via DDR_MTCR[MT_ADDR_EN], then a range of starting and ending address should be programed via DDR_MT_ST_ADDR and DDR_MT_END_ADDR registers. If range is not enabled the test will be conducted through entire memory defined by the CSn_BNDS registers.
There is also a selection on how the write-read-compare test should be done, whether 1 write burst, then 1 read burst and then compare. Or 2W, 2R. or ..., or write the entire range, then read the entire range. This selection is done via setting at DDR_MTCR[MT_TRANRND].
To start the test set the DDR_MTCR[MT_EN]. If the test completes, then the DDR_MTCR[MT_EN] will be cleared by HW. If test completes and there are test fails because of a comparison failure then a failure flag is set in DDR_MTCR[MT_STAT]. A test is considered passed when MT_EN clears and MT_STAT = 0.
Please refer to the QorIQ LS1043A Reference Manual:
18.4.59 DDR Memory Test Control Register (DDR_MTCR)
18.4.60 DDR Memory Test Pattern n Register (DDR_MTP0 - DDR_MTP9)
18.4.61 DDR Memory Test Start Extended Address (DDR_MT_ST_EXT_ADDR)
18.4.62 DDR Memory Test Start Address (DDR_MT_ST_ADDR)
18.4.63 DDR Memory Test End Extended Address (DDR_MT_END_EXT_ADDR)
18.4.64 DDR Memory Test End Address (DDR_MT_END_ADDR)