I'm developing a capacitive keyboard with Kinetis kl25 using the device TSI and have found a strong influence of the currents injected during the test EN 61000-4-6 causing false activation and wrong behaviour.
Has anyone had experience with immunity to the injected currents using the TSI device with or without touch library?
During the development of the TSI, how Freescale considered immunity to EN 61000-4-6?
Thanks in Advance
have you taken a look at Noise mode which is implemented in KL25? What did you test (TSI module or both TSS and TSI module? Did your EMC test cover only capacitive mode? The noise mode was directly designed for TSI measurement under EN 61000-4-6 testing.
Can you share some results?
I can paste code snippets how to initialize TSI noise mode and switch between the noise and the capacitive mode. The noise mode might be implemented in the next TSS release.
Hello Martin K.
I'm developing with kinetis KL36 using TSI and I found this discussion about TSI and immunity problems. I have the same problems explained by Erwin_74 under EN 61000-4-6 test.
I'm using TSI with TSS support (TSS version is 3.1.0) and the target have a capacitive keyboard built with ITO technology.
I'm trying all configurations and under EN 61000-4-6 test the best results are setting "AFID key detector"; setting "AFID key detector" the problems with noise injected are partially resolved, but if I remove the noise the TSI don't detect any touchs.
For set the TSI mode I use the macros on TSS_SystemSetup.h .
Is correct? Have you any suggestion?