LIN conformance test ISO 17987-6 for MCU S9KEAZN64AMLC

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LIN conformance test ISO 17987-6 for MCU S9KEAZN64AMLC

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rajivbandodkar
Contributor II

Hi,

Using Canoe to validate LIN conformance test as per ISO 17987-6. Attached is test case that is not being flagged as bit error. The Baud rate is 19200.

1. What is the issue?

2. Is there any LIN conformance certificate for this MCU?

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4 Replies

738 Views
Robin_Shen
NXP TechSupport
NXP TechSupport

Hi 

Please check the Lin Stack Test Report.zip which I sent you separately.


Best Regards,
Robin

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szpiech
Contributor I

Robin could you please share the lin stack report for S12ZVL please?

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rajivbandodkar
Contributor II

1. The report you shared is for device S12ZVL12, need for S9KEAZN64

2. Do you have any document for ISO 17987-6?

3. Any comment on the snap shot shared case with noise pulse in the start bit and the MCU is not reporting any bit error.

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747 Views
rajivbandodkar
Contributor II
Hi any update on the points raised?
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