The IR scan test uses the TCK and TMS pins to move the target into the Shift-IR state, and then sends a long
test pattern through the IR by holding TMS=0, clocking TCK, and feeding the test pattern bits in the TDI pin.
It captures the bits coming out on the TDO pin. If the connection is working correctly, the TDI bits pass through
the IR shift register (instruction register) and eventually show up on the TDO pin. The test compares the TDO
data it captures against the TDI test pattern it sent to see if TDO contains the test pattern. It expects to find the
test pattern in the TDO, but bit-shifted to the left by some number of bits (corresponding to the IR length).
If it fails to find the test pattern, then the test reports an error, Error testing IR scan.
If the test fails to measure the length of the instruction register, then an error, Error measuring IR length, is
thrown.
If there is no valid RCW on the target board, please use hard-coded RCW or JTAG configuration file in CodeWarrior, please refer to "8.4 Setting up a remote system to use a JTAG configuration file" in C:\Freescale\CW_PA_v10.5.1\PA\Help\PDF\Targeting_PA_Processors.pdf
