PN7462 MFOUT/SIGOUT Feature

mukadder — Tue, 22 Jan 2019 12:14:01 GMT

Dear,

Is there any output in PN7562 such that MFOUT* / SIGOUT* signal ouput feature like in MFRC563 ( i.e envelope of modulation ).
* This is mainly used for TYPE-B coding in analog signal output when using an external power amplifier in contactless part.

Best Regards.

Re: PN7462 MFOUT/SIGOUT Feature

mukadder — Wed, 23 Jan 2019 07:07:51 GMT

Edit: MFRC563 is written wrong.

it is MFRC523 / RC663

Re: PN7462 MFOUT/SIGOUT Feature

Jonathan_Iglesias — Thu, 07 Feb 2019 14:47:00 GMT

Dear Mukadder Ceyhan,

Hope you are doing great, I think that you would need is Digital or Analog test buses, this is an example how to configure it, this snippet from the "PN7462AU_ex_phExRfPoll" example.

#define PH_EXRF_TESTBUS1_SELECT 0x01
#define PH_EXRF_TESTBUS2_SELECT 0x02

    /* GPIO4 = tx_active.
     * GPIO5 = rx_active. */
    uint8_t aTestBus1Config[] = { 0x02, PH_EXRF_TESTBUS1_SELECT };
    uint8_t aTestBus2Config[] = { 0x06, PH_EXRF_TESTBUS2_SELECT };
   uint32_t dwClifAnalogTestBus[] = { 0xDD, 0x00301};

    status = phhalSysSer_CLIF_Config_DigitalTestBus((void *) aTestBus1Config);
    if (status != PH_ERR_SUCCESS)
    {
        LOG_TXT("Test Bus Configuration failed.");
    }

    status = phhalSysSer_CLIF_Config_DigitalTestBus((void *) aTestBus2Config);
    if (status != PH_ERR_SUCCESS)
    {
        LOG_TXT("Test Bus Configuration failed.");
    }

    status = phhalSysSer_CLIF_Config_AnalogTestBus(&dwClifAnalogTestBus[0]);
    if (status != PH_ERR_SUCCESS)
    {
        LOG_TXT("Test Bus Configuration failed.");
    }
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Please check the library package NFC Reader Library | NXP.

Jonathan

topic PN7462 MFOUT/SIGOUT Feature in NFC

PN7462 MFOUT/SIGOUT Feature

Re: PN7462 MFOUT/SIGOUT Feature

Re: PN7462 MFOUT/SIGOUT Feature