LPC Microcontrollers中的主题 LPC84x FlashROM Data retention

LPC84x FlashROM Data retention

jun1 — Tue, 14 May 2019 04:55:44 GMT

HI.

1. Is the flash ROM of the LPC84x NOR type?

2. Does this data retention period mean the life is calculated from the number of read errors that occur as a result of accelerated testing with the temperature turned on with the power on?

3. I think that the probability that the error of the flash ROM occurs in the power ON state changes with the temperature condition, for example, when the standard of Tamb = -40 ° C to +105 ° C is relaxed from -20 ° C to +70 ° C etc., the period is extended Is it?
I would be happy if you could tell me the formula.

# I do not think that English is not good.

Thank you.

Re: LPC84x FlashROM Data retention

vicentegomez — Tue, 11 Jun 2019 15:49:04 GMT

What do you mean with ROM type NOR, the internal structure? if this is the case this information can not be shared, this is internal information

On the following link, you can see some information about how the data retention is calculated, this is a reference

https://www.nxp.com/docs/en/engineering-bulletin/EB618.pdf

And yes with more temperature range there are more probabilities of failures, but there is not a formula that can be shared

Regards

Re: LPC84x FlashROM Data retention

jun1 — Tue, 11 Jun 2019 23:49:39 GMT

Hi.

I was able to understand the data retention characteristics.

I asked because the LPC series was MIN 10 years.

I understand this matter.

Thank you very much.