LPC1758 internal flash memory durability test

lpcware — Wed, 15 Jun 2016 17:34:25 GMT

Content originally posted in LPCWare by markf on Wed Nov 21 01:09:52 MST 2012
Hello,

I would like to ask about possibility of making an internal flash durability test, to know how many write/erase cycles are possible to do, before flash memory will destroy itself.

I'm thinking about method of writing some values (i.e. 0x00) filling a whole 256 byte page directly through IAP interface, and then using compare IAP command checking if the data was correctly written.

My test routine will be something like that:
1. Prepare sector
2. Erase sector
3. Compare first 256 bytes with 0xFF (check if the sector was correctly erased)
4. Prepare sector
5. Write 0x00 to first 256 bytes
6. Compare first 256 bytes with 0x00 value
7. Go to 1.

These erase/write cycles will be counted and checked for return value. If the return value will be other than zero, the test will stop.

Will it work? And am I thinking right? Please correct me if I am doing it wrong.

Cheers.

topic LPC1758 internal flash memory durability test in LPC Microcontrollers

LPC1758 internal flash memory durability test