Kinetis Microcontrollers中的主题 Re: IEC60730 RAM test and stack

IEC60730 RAM test and stack

zorrotz — Tue, 09 May 2017 07:42:52 GMT

Hi,

Using the variable memory test functions IEC60730B_CM4_CM7_RAM_RuntimeTest() and IEC60730B_CM4_CM7_RAM_AfterResetTest() provided by the core self-test library for Kinetis CM4 devices (IEC60730B_CM4_CM7_2.0), the stack can be inside the tested memory area?

And another question:

Can the tested memory area include part of upper RAM (address > 0x20000000) and part of lower RAM (address < 0x1FFFFFFF)?

Thanks

Re: IEC60730 RAM test and stack

Hui_Ma — Thu, 18 May 2017 07:36:57 GMT

Hi,

The RAM test doesn't include stack located SRAM range.

Just using K20_50MHz product as an example, the SRAM test range is from 0x1fffff00 to 0x20000100.

The Cstack size is 1KB, which located at upper SRAM range.

There also provides the stack test API function: IEC60730B_CM4_CM7_Stack_Test()

Wish it helps.

Have a great day,
Ma Hui

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Re: IEC60730 RAM test and stack

zorrotz — Thu, 18 May 2017 10:20:05 GMT

Hi,

IEC60730B_CM4_CM7_Stack_Test() is used for testing overflow and underflow conditions, not DC faults.

I have checked IEC60730B_CM4_CM7_RAM_RuntimeTest() function to test a memory area which includes the stack and it works OK.

Re: IEC60730 RAM test and stack

mjbcswitzerland — Thu, 18 May 2017 14:49:22 GMT

Have a look at this - http://www.utasker.com/docs/uTasker/uTasker_RAM_test.pdf
maybe it is more or less what is required? It is included in the uTasker project and allows continuous testing of all of internal RAM integrity during run time.

Regards

Mark

Re: IEC60730 RAM test and stack

Hui_Ma — Fri, 19 May 2017 08:30:11 GMT

Yes, I also checked the <IEC60730_B_Variable_Memory_test_for_CM4_CM7_ctm_rev1_1.pdf> file mentioned the variable memory test will cover the application stack area.

I need to check with related engineer how to test the application stack located RAM area.

I will let you know when there with any feedback.

Thank you for the patience.

Have a great day,
Ma Hui

Re: IEC60730 RAM test and stack

Hui_Ma — Wed, 31 May 2017 03:12:52 GMT

Please check the feedback from IEC60730 software team:

If you are doing the test after the reset it is clear to test all the RAM and also with the stack. The tested section of the RAM memory is copied to the backup location and after the testing is copied back to the original location.

The same situation is when you using the run-time test function, only what you need to check is the memory ranges for the testing of IEC60730B tests and these memory location cannot be on the same place as the application stack.

Wish it helps.

Have a great day,
Ma Hui

Re: IEC60730 RAM test and stack

frank涛李 — Mon, 12 Feb 2018 01:53:54 GMT

Hi Hui_Ma,

Could you give me a piece of IEC60730 routines,I'm searching for the routines but meeting problems.You can email to me.leefrank1013@gmail.com.

Regards,

Frank

Re: IEC60730 RAM test and stack

Hui_Ma — Mon, 12 Feb 2018 07:03:11 GMT

Hi Frank,

Please contact with your local NXP Distributor to get the IEC60730 software.

Thank you for the understanding.

best regards,

Mike