DDR Stress Test Result Differences Between Different Versions

swidmark — Tue, 25 Jul 2017 14:51:56 GMT

I have a PCB with an MCIMX6S5EVM10AC that is not booting correctly and it seems like it's an issue with our DDR3 RAM. To verify this, I ran the DDR stress test tool V2.60 but found no issues. I also tried V2.30 with no issues. However, when I run V1.0.2 or V1.0.3 I consistently get the following error:

loop: 1

DDR Freq: 396 MHz

t0.1: data is addr test

t0: memcpy11 SSN test

t1: memcpy8 SSN test

Address of test1 failure: 0x2c022014

Data was: 0x00000024

But pattern was: 0x00000004

It also seems that V1.0.2 and V1.0.3 take significantly longer to run.

When I test a known good PCB, it passes the DDR stress test on V2.60, V2.30, V1.0.3, and V1.0.2.

Why are there differences between different versions of the stress tester? I would expect the results to be the same no matter what version I am running.

Re: DDR Stress Test Result Differences Between Different Versions

joanxie — Thu, 27 Jul 2017 05:42:31 GMT

For feature list v2.6:

Added support for i.MX7D calibration operation
Added support for NXP i.MX6ULL component

because of limited information, I send the two tools detailed inforamtion to you for reference, you can focus on the old version, to check if you set corretly or not

i.MX6/7 DDR Stress Test Tool V2.60

https://community.nxp.com/docs/DOC-96412

topic Re: DDR Stress Test Result Differences Between Different Versions in i.MX Processors

DDR Stress Test Result Differences Between Different Versions

Re: DDR Stress Test Result Differences Between Different Versions