topic Re: S32K312 Fault Injection without SAF in S32K

S32K312 Fault Injection without SAF

linxianti — Mon, 27 Oct 2025 06:59:29 GMT

Hello team

If SAF and SPD aren't used in the application, is it possible to inject a fault in FCCU in order to test the reactions for these kind of faults?

I found the Non-critical Fault Fake(NCFF) register in the Reference Manual. Will fault be injected if write a value in this register?

Thanks. & Regards.

Xianti

Re: S32K312 Fault Injection without SAF

danielmartynek — Mon, 27 Oct 2025 08:47:34 GMT

Hello @linxianti,

SAF and SPD inject faults into peripheral hardware via the EIM (Error Injection Module).
In contrast, the NCFF register injects faults directly into the FCCU, without affecting peripheral hardware.
If your goal is to test FCCU fault handling independently of peripheral fault sources, using NCFF is appropriate.

Regards,

Daniel

Re: S32K312 Fault Injection without SAF

linxianti — Mon, 27 Oct 2025 09:24:56 GMT

Hello Daniel

Thanks for your reply.

Regarding the EIM, does EIM only used to inject fault related with memory. Because i found this description in the Reference Manual. It doesn't apply for the other fault injection, e.g. clock fault or voltage fault, right?

If yes, how can we inject this kind of fault except writing NCFF. Because writing NCFF can only verify the handling of fault, doesn't cover the detection of fault.

Thanks.& Regards.

Xianti

Re: S32K312 Fault Injection without SAF

danielmartynek — Tue, 04 Nov 2025 16:39:46 GMT

Hi @linxianti,

The CMU is not connected to the FCCU, and only a few VLD sources are linked.
For reference, here is a simple CMU example that uses the RTD MCAL MCU driver:

https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K344-MCAL-MCU-ClockMonitor-v1-0-S32DS36-RTD600/ta-p/2179976

To test LVD functionality, you can manipulate the power supply voltage.

By the way, SPD/SAF also use the NCFF injection:

Regards,

Daniel

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