S32K312 Destructive reset and functional reset query

raj12 — Tue, 23 Jul 2024 14:23:21 GMT

Hello

I have query related to destructive reset and functional reset.

How to create the test scenario for testing of PLL_LOL in case of destructive reset else destructive reset will trigger by MCU automatically once event will trigger.
How to create the test scenario for testing of SYS_DIV_FAIL in case of destructive reset else destructive reset will trigger by MCU automatically once event will trigger.
How to create the test scenario for testing of DEBUG_DEST in case of destructive reset else destructive reset will trigger by MCU automatically once event will trigger.

How to create the test scenario for testing of PLL_AUX_RST in case of functional reset else functional reset will trigger by MCU automatically once event will trigger.
How to create the test scenario for testing of JTAG_RST in case of functional reset else functional reset will trigger by MCU automatically once event will trigger.
How to create the test scenario for testing of DEBUG_FUNC in case of functional reset else functional reset will trigger by MCU automatically once event will trigger.

Please provide the inline reply. If demo software is available, the provide us. It will be helpful for our development.

Thanks

Re: S32K312 Destructive reset and functional reset query

vihera — Tue, 15 Oct 2024 18:13:25 GMT

I'm investigating the same fault list for S32K324/344.

The only I could trigger is PLL_LOL by shorting to ground one of the Capacitors connected to the embedded oscillator.

topic Re: S32K312 Destructive reset and functional reset query in S32K

S32K312 Destructive reset and functional reset query

Re: S32K312 Destructive reset and functional reset query