topic Re: UTEST memory area for factory data in S32K

UTEST memory area for factory data

FelixR — Thu, 13 Jun 2024 18:24:04 GMT

Hello there,

I am looking for a memory location on the S32K324 to store our factory data like the user hardware revision, softwar version, bootloader version and so on and I stumbled uppon the dcf_client_sdid0-15 entries in the UTEST Memory area and the DCF Clients sheet which apparently are made for that. But I am a bit confused about this Memory since the processor uses this area for some setups during boot as far as I did understand it. So I was wondering if this is even the right place to store my factory data?

regards,
Felix.

Re: UTEST memory area for factory data

petervlna — Fri, 14 Jun 2024 05:00:02 GMT

Hello,

You can store your factory data in the following location:

The first 2 marked locations are made for that purpose.

In case you require more space you can also use DCF records space, but you must pay attention here to not overwrite DCFs.
In such case it is best to add it after stop record which is represented here by 0xFFFF_FFFF. I would do this only once DCFs are finalized and no more will be added. Also I will leave a enough space in case some will be added in future.

Best regards,

Peter

Re: UTEST memory area for factory data

FelixR — Mon, 24 Jun 2024 06:21:37 GMT

Ah I see. One last quick question. I read in the reference manual that the UTEST area is OTP but it is a bit ambiguous "when" it is OTP. The reference manual says that "the UTest NVM sector is an OTP sector (assuming Test mode disable seal is written)". Does that mean that until I write the Test mode disable seal I can write multiple times inside my UTest Area, probably over my planned factory data just in case I write it wrongly?

Re: UTEST memory area for factory data

petervlna — Tue, 25 Jun 2024 04:47:38 GMT

Hello,

No. You cant rewrite data in OTP as customer.

The UTEST flash is made OTP via burning out TEST mode fuse in NXP factory.

There is no reverse possibility. It is permanent.

You simply tune the OTP in your development, which will maybe require several chips to be used for that purpose. But for factory production you will go with only one config as majority of customers.

Best regards,

Peter

Re: UTEST memory area for factory data

Sanjana_k — Fri, 28 Nov 2025 18:15:53 GMT

hello @FelixR did u get the solution ? If yes please do share the solution

Thank you

Re: UTEST memory area for factory data

FelixR — Mon, 01 Dec 2025 10:29:35 GMT

Hey @Sanjana_k, in the end I started using a slice of the DCFrecord area for my OTP data. As stated by @petervlna in the solution, I could have used the two application areas inside the OTP data but... that's not feasable since they are to small.

I just ensure during build that the Data I plan to write into this is not accidentally formated like DCF start Record (See the reference Manual Table 223) so I don't corrupt any processor functionality.