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    <title>topic HSE lifecycle state in S32K</title>
    <link>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1718810#M26879</link>
    <description>&lt;P&gt;Hello,&lt;/P&gt;&lt;P&gt;In our company we are working on a project having the HSE_B module (micro MWCT2016S) and I wanted to ask some questions regarding the life cycle (LC) state:&lt;/P&gt;&lt;P&gt;- How the system attribute to manage this state can be triggered? Can it be done via UDS?&lt;/P&gt;&lt;P&gt;-&amp;nbsp; I see that advancing to PRE_FA and FA can only be done by NXP, how? What type of test features are "unlocked" in those states?&lt;/P&gt;&lt;P&gt;- Is it possible to have internal test analysis of pieces coming from field mantaining the LC state to IN_FIELD?&amp;nbsp;&lt;/P&gt;&lt;P&gt;Thank you in advance for your feedback.&lt;/P&gt;</description>
    <pubDate>Thu, 07 Sep 2023 12:38:05 GMT</pubDate>
    <dc:creator>ale_di_vi</dc:creator>
    <dc:date>2023-09-07T12:38:05Z</dc:date>
    <item>
      <title>HSE lifecycle state</title>
      <link>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1718810#M26879</link>
      <description>&lt;P&gt;Hello,&lt;/P&gt;&lt;P&gt;In our company we are working on a project having the HSE_B module (micro MWCT2016S) and I wanted to ask some questions regarding the life cycle (LC) state:&lt;/P&gt;&lt;P&gt;- How the system attribute to manage this state can be triggered? Can it be done via UDS?&lt;/P&gt;&lt;P&gt;-&amp;nbsp; I see that advancing to PRE_FA and FA can only be done by NXP, how? What type of test features are "unlocked" in those states?&lt;/P&gt;&lt;P&gt;- Is it possible to have internal test analysis of pieces coming from field mantaining the LC state to IN_FIELD?&amp;nbsp;&lt;/P&gt;&lt;P&gt;Thank you in advance for your feedback.&lt;/P&gt;</description>
      <pubDate>Thu, 07 Sep 2023 12:38:05 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1718810#M26879</guid>
      <dc:creator>ale_di_vi</dc:creator>
      <dc:date>2023-09-07T12:38:05Z</dc:date>
    </item>
    <item>
      <title>Re: HSE lifecycle state</title>
      <link>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1720926#M26978</link>
      <description>&lt;P&gt;Hi &lt;a href="https://community.nxp.com/t5/user/viewprofilepage/user-id/218511"&gt;@ale_di_vi&lt;/a&gt;&amp;nbsp;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;- How the system attribute to manage this state can be triggered? Can it be done via UDS?&lt;/SPAN&gt;&lt;BR /&gt;&lt;SPAN&gt;[Lukas] If HSE firmware is installed, the life cycle can be advanced by HSE system attribute management services (HSE_SRV_ID_SET_ATTR and HSE_SECURE_LIFECYCLE_ATTR_ID). It’s up to user to trigger this service by software. It doesn’t matter what kind of protocol or communication interface is used to trigger this service. &lt;/SPAN&gt;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;&amp;nbsp;&lt;/SPAN&gt;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;- I see that advancing to PRE_FA and FA can only be done by NXP, how? What is the process to advance the status and what type of test features are "unlocked" in those states?&lt;/SPAN&gt;&lt;BR /&gt;&lt;SPAN&gt;[Lukas] As mentioned, it can be done only by NXP for testing in NXP facility, so we do not share more details. &lt;/SPAN&gt;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;&amp;nbsp;&lt;/SPAN&gt;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;- Is it possible to have internal test analysis of pieces coming from field mantaining the LC state to IN_FIELD? &lt;/SPAN&gt;&lt;BR /&gt;&lt;SPAN&gt;[Lukas] No, it’s necessary to advance the LC at least to PRE_FA because internal test features are not available in IN_FIELD LC. &lt;/SPAN&gt;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;&amp;nbsp;&lt;/SPAN&gt;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;Regards,&lt;/SPAN&gt;&lt;/P&gt;
&lt;P&gt;&lt;SPAN&gt;Lukas&lt;/SPAN&gt;&lt;/P&gt;</description>
      <pubDate>Tue, 12 Sep 2023 07:22:08 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1720926#M26978</guid>
      <dc:creator>lukaszadrapa</dc:creator>
      <dc:date>2023-09-12T07:22:08Z</dc:date>
    </item>
    <item>
      <title>Re: HSE lifecycle state</title>
      <link>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1721013#M26986</link>
      <description>&lt;P&gt;&lt;SPAN class=""&gt;Hi &lt;a href="https://community.nxp.com/t5/user/viewprofilepage/user-id/37795"&gt;@lukaszadrapa&lt;/a&gt;,&lt;/SPAN&gt;&lt;/P&gt;&lt;P&gt;&lt;SPAN class=""&gt;Thank you for your feedback.&amp;nbsp;&lt;/SPAN&gt;&lt;SPAN&gt;As far as I understood from your responses, testing analysis can only be done in NXP facility and not by OEM/TIER1 supplier. I am right?&lt;/SPAN&gt;&lt;/P&gt;&lt;P&gt;&lt;SPAN class=""&gt;Also, is the management of the LC state actually needed to lock the JTAG port? Can it be protected without taking care of the LC state?&lt;/SPAN&gt;&lt;/P&gt;</description>
      <pubDate>Tue, 12 Sep 2023 08:40:37 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1721013#M26986</guid>
      <dc:creator>ale_di_vi</dc:creator>
      <dc:date>2023-09-12T08:40:37Z</dc:date>
    </item>
    <item>
      <title>Re: HSE lifecycle state</title>
      <link>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1721124#M26991</link>
      <description>&lt;P&gt;Yes, that's correct. &lt;BR /&gt;The debug port is unrestricted in CUST_DEL LC. To enable debug authorization, the LC must be advanced to OEM_PROD or IN_FIELD (and set the password or key etc.). &lt;BR /&gt;Notice that the debug port can't be disabled completely. It is only possible to enable the debug authorization.&lt;/P&gt;</description>
      <pubDate>Tue, 12 Sep 2023 10:39:42 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/HSE-lifecycle-state/m-p/1721124#M26991</guid>
      <dc:creator>lukaszadrapa</dc:creator>
      <dc:date>2023-09-12T10:39:42Z</dc:date>
    </item>
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