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    <title>S32KのトピックRe: S32K Data retention (in data-flash)</title>
    <link>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611965#M167</link>
    <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;P&gt;Hi Yves,&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;minimal data retention is always valid across whole temperature range and whole supply voltage range. Conditions for typical data retention are explicitly mentioned in datasheet (25°C...).&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;Regards,&lt;/P&gt;&lt;P&gt;Lukas&lt;/P&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
    <pubDate>Mon, 06 Mar 2017 08:12:00 GMT</pubDate>
    <dc:creator>lukaszadrapa</dc:creator>
    <dc:date>2017-03-06T08:12:00Z</dc:date>
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      <title>S32K Data retention (in data-flash)</title>
      <link>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611964#M166</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;P&gt;The Data-sheets v1 specify a min and typ data retention for the&amp;nbsp;data-flash. The typical number corresponds to an average temperature of 25°C and to nominal supply voltages. How is the minimum number defined (average temperature, supply levels)?&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;We used to have the EB618 (attached) to explain the way data retention is specified for various technology, but it is now outdated. It would be great to have a table similar to table 1, including the TFS90 technology:&lt;/P&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Wed, 01 Mar 2017 16:16:06 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611964#M166</guid>
      <dc:creator>yvesbriant</dc:creator>
      <dc:date>2017-03-01T16:16:06Z</dc:date>
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    <item>
      <title>Re: S32K Data retention (in data-flash)</title>
      <link>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611965#M167</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;P&gt;Hi Yves,&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;minimal data retention is always valid across whole temperature range and whole supply voltage range. Conditions for typical data retention are explicitly mentioned in datasheet (25°C...).&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;Regards,&lt;/P&gt;&lt;P&gt;Lukas&lt;/P&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Mon, 06 Mar 2017 08:12:00 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611965#M167</guid>
      <dc:creator>lukaszadrapa</dc:creator>
      <dc:date>2017-03-06T08:12:00Z</dc:date>
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    <item>
      <title>Re: S32K Data retention (in data-flash)</title>
      <link>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611966#M168</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;P&gt;Hello Lukas,&lt;/P&gt;&lt;P&gt;That's what i told to my customer, but they need more details. For the S12Z devices, we explicitly specify the average temperature we considered for the min specification for the data retention&amp;nbsp;(see below), here 85°C. I would be interested to know what average temperature we&amp;nbsp;considered for the S32K.&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;&lt;span class="lia-inline-image-display-wrapper" image-alt="Capture.PNG"&gt;&lt;img src="https://community.nxp.com/t5/image/serverpage/image-id/14868i7EAA8399905C9A65/image-size/large?v=v2&amp;amp;px=999" role="button" title="Capture.PNG" alt="Capture.PNG" /&gt;&lt;/span&gt;&lt;/P&gt;&lt;P&gt;&lt;SPAN style="font-size: 13px;"&gt;&lt;SPAN&gt;1 &lt;/SPAN&gt;&lt;SPAN&gt;T&lt;/SPAN&gt;&lt;SPAN&gt;Javg &lt;/SPAN&gt;&lt;SPAN&gt;does not exceed 85&lt;/SPAN&gt;&lt;SPAN lang="ZH-TW"&gt;&lt;/SPAN&gt;&lt;SPAN&gt;C in a typical temperature profile over the lifetime of a consumer, industrial or automotive application.&lt;/SPAN&gt;&lt;/SPAN&gt;&lt;/P&gt;&lt;P&gt;&lt;SPAN style="font-size: 13px;"&gt;&lt;SPAN&gt;&lt;SPAN&gt;2 &lt;/SPAN&gt;&lt;/SPAN&gt;&lt;SPAN&gt;&lt;SPAN&gt;Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to 25&lt;/SPAN&gt;&lt;/SPAN&gt;&lt;SPAN lang="ZH-TW"&gt;&lt;SPAN lang="ZH-TW"&gt;&lt;/SPAN&gt;&lt;/SPAN&gt;&lt;SPAN&gt;&lt;SPAN&gt;C using the &lt;/SPAN&gt;&lt;/SPAN&gt;Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please refer to Engineering Bulletin EB618&lt;/SPAN&gt;&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;Thanks !&lt;/P&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Tue, 07 Mar 2017 13:10:36 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611966#M168</guid>
      <dc:creator>yvesbriant</dc:creator>
      <dc:date>2017-03-07T13:10:36Z</dc:date>
    </item>
    <item>
      <title>Re: S32K Data retention (in data-flash)</title>
      <link>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611967#M169</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;P&gt;I sent you an email...&lt;/P&gt;&lt;P&gt;&lt;/P&gt;&lt;P&gt;Lukas&lt;/P&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Thu, 09 Mar 2017 08:51:47 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32K/S32K-Data-retention-in-data-flash/m-p/611967#M169</guid>
      <dc:creator>lukaszadrapa</dc:creator>
      <dc:date>2017-03-09T08:51:47Z</dc:date>
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