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    <title>topic Re: Testing BIST in S32G</title>
    <link>https://community.nxp.com/t5/S32G/Testing-BIST/m-p/1841396#M6569</link>
    <description>&lt;P&gt;Hi,&lt;/P&gt;
&lt;P&gt;All information on regards of BIST should be contained under the "doc" folder inside the "BIST" folder, similar to the path shown below:&lt;/P&gt;
&lt;P&gt;"s32g_spd_1_9_0\Bist\doc"&lt;/P&gt;
&lt;P&gt;On regards of the 2nd point, reconfiguration of the BIST settings is not recommended by NXP. As told under the BIST User Manual [Page 7-8, UM40BISTSPDR1.9.0, Rev 3.0, 02/2022]:&lt;/P&gt;
&lt;P&gt;"It should be noted that the user is not required to perform any other configuration for the&lt;BR /&gt;startup self-test other than correctly providing the self-test DCD image as shown above.&lt;BR /&gt;The self-test DCD covers only the critical sections of MRD to keep boot time short and it&lt;BR /&gt;is then the responsibility of the application to initiate other necessary BIST execution from&lt;BR /&gt;the application.&lt;/P&gt;
&lt;P&gt;...&lt;/P&gt;
&lt;P&gt;Any modification of this sequence will&lt;BR /&gt;change the coverage levels achieved and is therefore not recommended or guaranteed. "&lt;/P&gt;
&lt;P&gt;Please, let us know.&lt;/P&gt;</description>
    <pubDate>Fri, 05 Apr 2024 15:48:40 GMT</pubDate>
    <dc:creator>Daniel-Aguirre</dc:creator>
    <dc:date>2024-04-05T15:48:40Z</dc:date>
    <item>
      <title>Testing BIST</title>
      <link>https://community.nxp.com/t5/S32G/Testing-BIST/m-p/1841224#M6566</link>
      <description>&lt;P&gt;I'm currently working on testing the functionality of NXP hardware using Built-In Self-Test (BIST) features, and I could use some guidance on the process.&lt;/P&gt;&lt;P&gt;Specifically, I'm looking for assistance with the following:&lt;/P&gt;&lt;OL&gt;&lt;LI&gt;Process of loading BIST images onto the target hardware.&lt;/LI&gt;&lt;LI&gt;Configuring BIST settings, such as test parameters and modes.&lt;/LI&gt;&lt;/OL&gt;&lt;P&gt;If you have experience with similar tasks or can point me towards relevant documentation or examples, that would be incredibly helpful.&lt;/P&gt;</description>
      <pubDate>Fri, 05 Apr 2024 10:23:26 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32G/Testing-BIST/m-p/1841224#M6566</guid>
      <dc:creator>Vrushank</dc:creator>
      <dc:date>2024-04-05T10:23:26Z</dc:date>
    </item>
    <item>
      <title>Re: Testing BIST</title>
      <link>https://community.nxp.com/t5/S32G/Testing-BIST/m-p/1841396#M6569</link>
      <description>&lt;P&gt;Hi,&lt;/P&gt;
&lt;P&gt;All information on regards of BIST should be contained under the "doc" folder inside the "BIST" folder, similar to the path shown below:&lt;/P&gt;
&lt;P&gt;"s32g_spd_1_9_0\Bist\doc"&lt;/P&gt;
&lt;P&gt;On regards of the 2nd point, reconfiguration of the BIST settings is not recommended by NXP. As told under the BIST User Manual [Page 7-8, UM40BISTSPDR1.9.0, Rev 3.0, 02/2022]:&lt;/P&gt;
&lt;P&gt;"It should be noted that the user is not required to perform any other configuration for the&lt;BR /&gt;startup self-test other than correctly providing the self-test DCD image as shown above.&lt;BR /&gt;The self-test DCD covers only the critical sections of MRD to keep boot time short and it&lt;BR /&gt;is then the responsibility of the application to initiate other necessary BIST execution from&lt;BR /&gt;the application.&lt;/P&gt;
&lt;P&gt;...&lt;/P&gt;
&lt;P&gt;Any modification of this sequence will&lt;BR /&gt;change the coverage levels achieved and is therefore not recommended or guaranteed. "&lt;/P&gt;
&lt;P&gt;Please, let us know.&lt;/P&gt;</description>
      <pubDate>Fri, 05 Apr 2024 15:48:40 GMT</pubDate>
      <guid>https://community.nxp.com/t5/S32G/Testing-BIST/m-p/1841396#M6569</guid>
      <dc:creator>Daniel-Aguirre</dc:creator>
      <dc:date>2024-04-05T15:48:40Z</dc:date>
    </item>
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