<?xml version="1.0" encoding="UTF-8"?>
<rss xmlns:content="http://purl.org/rss/1.0/modules/content/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:taxo="http://purl.org/rss/1.0/modules/taxonomy/" version="2.0">
  <channel>
    <title>topic Re: Production test equipment in 8-bit Microcontrollers</title>
    <link>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139263#M5276</link>
    <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;DIV&gt;Hello,&lt;/DIV&gt;&lt;DIV&gt;A few examples of problems:&lt;/DIV&gt;&lt;DIV&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;- Short circuits on outputs with conflicting level --&amp;gt; MCU burnt&lt;/DIV&gt;&lt;DIV&gt;- Conflict in PLL CGMXFC level --&amp;gt; Wrong clock speed&lt;/DIV&gt;&lt;DIV&gt;- Conflict between ADC levels --&amp;gt; wrong ADC measures&lt;/DIV&gt;&lt;DIV&gt;- Input impedance divided --&amp;gt; draw more current&lt;/DIV&gt;&lt;DIV&gt;- Conflict in comms lines --&amp;gt; No message sent or received.&lt;/DIV&gt;&lt;DIV&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;There are more problems...&lt;/DIV&gt;&lt;DIV&gt;Cheers,&lt;/DIV&gt;&lt;DIV&gt;Alban.&lt;/DIV&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
    <pubDate>Wed, 06 Dec 2006 23:40:12 GMT</pubDate>
    <dc:creator>Alban</dc:creator>
    <dc:date>2006-12-06T23:40:12Z</dc:date>
    <item>
      <title>Production test equipment</title>
      <link>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139262#M5275</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;SPAN&gt;Hi,&lt;/SPAN&gt;&lt;BR /&gt;&lt;BR /&gt;&lt;SPAN&gt;I´m developing a production test equipment based on needles. In the way that I´m thinking, I will need to put 2 microcontrollers GT32 working in parallel (each pin connected with the other physically). The problem is that each microcontroller will execute differents programs. What problems can I find trying to do it?&lt;/SPAN&gt;&lt;BR /&gt;&lt;BR /&gt;&lt;SPAN&gt;Thanks&lt;/SPAN&gt;&lt;BR /&gt;&lt;BR /&gt;&lt;SPAN&gt;Emerson&lt;/SPAN&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Wed, 06 Dec 2006 23:25:41 GMT</pubDate>
      <guid>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139262#M5275</guid>
      <dc:creator>Br</dc:creator>
      <dc:date>2006-12-06T23:25:41Z</dc:date>
    </item>
    <item>
      <title>Re: Production test equipment</title>
      <link>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139263#M5276</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;DIV&gt;Hello,&lt;/DIV&gt;&lt;DIV&gt;A few examples of problems:&lt;/DIV&gt;&lt;DIV&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;- Short circuits on outputs with conflicting level --&amp;gt; MCU burnt&lt;/DIV&gt;&lt;DIV&gt;- Conflict in PLL CGMXFC level --&amp;gt; Wrong clock speed&lt;/DIV&gt;&lt;DIV&gt;- Conflict between ADC levels --&amp;gt; wrong ADC measures&lt;/DIV&gt;&lt;DIV&gt;- Input impedance divided --&amp;gt; draw more current&lt;/DIV&gt;&lt;DIV&gt;- Conflict in comms lines --&amp;gt; No message sent or received.&lt;/DIV&gt;&lt;DIV&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;There are more problems...&lt;/DIV&gt;&lt;DIV&gt;Cheers,&lt;/DIV&gt;&lt;DIV&gt;Alban.&lt;/DIV&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Wed, 06 Dec 2006 23:40:12 GMT</pubDate>
      <guid>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139263#M5276</guid>
      <dc:creator>Alban</dc:creator>
      <dc:date>2006-12-06T23:40:12Z</dc:date>
    </item>
    <item>
      <title>Re: Production test equipment</title>
      <link>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139264#M5277</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;Hello Emerson,&lt;/FONT&gt;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;&lt;/FONT&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;I am not entirely sure what you are trying to achieve.&amp;nbsp; Are you attempting to test a MCU device or board, using another similar MCU containing test firmware, to automatically sequence inputs and sense the ouputs of the device under test?&lt;/FONT&gt;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;&lt;/FONT&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;If so, not all pins may be paralleled, as Alban has already&amp;nbsp;indicated.&lt;/FONT&gt;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;&lt;/FONT&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;Some of the peripherals would need to be tested using entirely seperate sources of test excitation - the ATD inputs would fall in this category.&amp;nbsp; Testing the SCI functionality would require that TXD on one device&amp;nbsp;be connected to RXD of the other device, in&amp;nbsp;each direction.&amp;nbsp; It would also be a wise precaution to include series resistors to limit current in case there is I/O conflict.&lt;/FONT&gt;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;&lt;/FONT&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;Regards,&lt;/FONT&gt;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;Mac&lt;/FONT&gt;&lt;/DIV&gt;&lt;DIV&gt;&lt;FONT size="2"&gt;&lt;/FONT&gt;&amp;nbsp;&lt;/DIV&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Thu, 07 Dec 2006 02:42:59 GMT</pubDate>
      <guid>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139264#M5277</guid>
      <dc:creator>bigmac</dc:creator>
      <dc:date>2006-12-07T02:42:59Z</dc:date>
    </item>
    <item>
      <title>Re: Production test equipment</title>
      <link>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139265#M5278</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;Hi,&lt;BR /&gt;&lt;BR /&gt;Consideranting only the pins directions. What kind of conflicts can happen connecting pins with differents or equal directions.&lt;BR /&gt;&lt;BR /&gt;Regards,&lt;BR /&gt;&lt;BR /&gt;Emerson&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Thu, 07 Dec 2006 23:45:44 GMT</pubDate>
      <guid>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139265#M5278</guid>
      <dc:creator>Br</dc:creator>
      <dc:date>2006-12-07T23:45:44Z</dc:date>
    </item>
    <item>
      <title>Re: Production test equipment</title>
      <link>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139266#M5279</link>
      <description>&lt;HTML&gt;&lt;HEAD&gt;&lt;/HEAD&gt;&lt;BODY&gt;&lt;DIV&gt;Hi Emerson,&lt;/DIV&gt;&lt;DIV&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;The biggest problem is if you tie two outputs together and one wants to be high and the other low. Things get hot and then stop working.&lt;/DIV&gt;&lt;DIV&gt;&amp;nbsp;&lt;/DIV&gt;&lt;DIV&gt;Regards&lt;/DIV&gt;&lt;DIV&gt;Peg&lt;/DIV&gt;&lt;DIV&gt;&amp;nbsp;&lt;/DIV&gt;&lt;/BODY&gt;&lt;/HTML&gt;</description>
      <pubDate>Fri, 08 Dec 2006 05:04:18 GMT</pubDate>
      <guid>https://community.nxp.com/t5/8-bit-Microcontrollers/Production-test-equipment/m-p/139266#M5279</guid>
      <dc:creator>peg</dc:creator>
      <dc:date>2006-12-08T05:04:18Z</dc:date>
    </item>
  </channel>
</rss>

