S12 / MagniV MicrocontrollersのトピックThe LIN stack test log of S12ZVL MCU

The LIN stack test log of S12ZVL MCU

dustyko — Wed, 21 Jun 2017 13:38:41 GMT

Hi :

I am using FSL LIN 2.x Stack Package 4.5.7 in S12ZVL MCU.

There is a test log in this LIN 2.x Stack Package ( please to see the attached file ).

After reviewed this test log , my end customer find a warning in some of test items is as below.

Does anyone can explain the following warnings ?
It seems that is the test equipment limited the capabilities.

Is it right ?

Thanks.

2.1 3.2 Variation of Length of break field low phase: Passed

Test case begin:	2016-05-05 14:41:13	(logging timestamp 8.330741)
Test case end:	2016-05-05 14:41:36	(logging timestamp 31.574407)

Verdict Information

Test case could not be fully executed!
Test Case Sequence

Timestamp	Test Step	Description	Result
8.330741	Initialization	Triggering manual IUT HW-reset	-
9.490509		Tester confirmation with 'Yes'.	-
9.510509	Initialization	Due to XL-hardware capabilities this testcase performed with 1 bit time steps instead of required 0.1 bit time steps	warning

2.19 3.13.1 Bit rate tolerance, IUT without making use of synchronization. Master deviation from nominal bit rate = + 0.5%: Passed

Test case begin:	2016-05-05 14:42:06	(logging timestamp 61.554794)
Test case end:	2016-05-05 14:42:07	(logging timestamp 62.951864)

Verdict Information

Test case could not be fully executed!
Test Case Sequence

Timestamp	Test Step	Description	Result
61.554794	Initialization	Triggering manual IUT HW-reset	-
62.801509		Tester confirmation with 'Yes'.	-
62.821509	Execution	Sending ReadByIdentifier (Id=2) with master bit rate = 9600 bps	-
62.821509	Execution	Due to XL-hardware capabilities ReadByIdentifier request in this testcase sent with the nominal master bit rate 9600 bps instead of required 9648 bps	warning
62.836201	Execution	Send ReadByIdentifier request (Id=2, NAD=0x5, SID=0x1E, FID=0x2)	pass

Original Attachment has been moved to: CanoeMaster_9600_S122zvl32_9600_autobaud_no.html.zip

Re: The LIN stack test log of S12ZVL MCU

RadekS — Fri, 23 Jun 2017 12:17:08 GMT

Hi Dusty,
Yes, that is the limitation of the test equipment that we used for Regression Test for porting LIN Stack to support new platforms. The limitation is explained clearly in the description related to “Warning”.

The LIN Stack Package v4.5.7 for S12Z has the Certificate of LIN 2.2A Conformance for Master and Slave Nodes with other qualified test equipment.

I hope it helps you.

Have a great day,
Radek

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Re: The LIN stack test log of S12ZVL MCU

dustyko — Thu, 06 Jul 2017 03:21:06 GMT

Hi Radek :

Thank you for all your assistance !!

I have implemented my LIN functions in S12ZVL MCU based on LIN Stack Package v4.5.7.

This LIN Stack Package is a powerful tool and easy to use , thanks.

Because my end customer very care this system's reliability.

We need to provide some of reliability test data , example : ageing parameters , LIN protocol certification report and LIN resynchronization function.

So, may I have some of your comments about the questions is as below :

1. May I have the certification report about LIN 2.2A conformance ?

2. Do you have any idea about LIN resynchronization function ?

I have got some of information from NXP Application Note : AN3756.

It seems this function just implemented in some of S08 MCU , I think I need to add this function to S12ZVL MCU.

Thank you again for everything you're done.

Best Regards,

Dusty Ko