Bluetooth LE product qualification covering erratum 10734

Document created by Gerardo Rodríguez Employee on May 28, 2019
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With the release of the Bluetooth LE core erratum 10734, two new Host test cases (SM/SLA/KDU/BI-01-C and SM/MAS/KDU/BI-01-C) were added to the Test Case Reference List (TCRL) and are active since 24-Jan-19. This has an impact on new product qualifications based on Component (Tested) QDIDs that used an older TCRL when the test cases for this erratum were not required.


Products that rely on NXP HOST QDIDs have 2 options for covering the erratum 10734 in order to complete the qualification:

  1. NXP provides a new qualification/QDID that includes these 2 tests. This is scheduled for later this year for QN908x, KW35/36 and KW41/31 products.
  2. NXP provides the test evidence/logs for these 2 tests and the test house reviews them before completing the product qualification.


Right now, option 2 can be followed using the test evidence/logs provided by NXP. Later in the year, option 1 can be followed with an updated QDID.


To obtain the test evidence/logs, please submit a support request.